DocumentCode
2869505
Title
Selectable Length Partial Scan: A Method to Reduce Vector Length
Author
Morley, Sean P. ; Marlett, Ralph A.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
385
Keywords
Application specific integrated circuits; Automatic generation control; Automatic testing; Circuit testing; Clocks; Equations; Pins; Protocols; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519698
Filename
519698
Link To Document