Author :
Yoon, Euisik ; Ayazi, Farrokh
Author_Institution :
University of Minnesota, Minneapolis, MN
Keywords :
CMOS process; CMOS technology; Capacitive sensors; Integrated circuit technology; Magnetic field induced strain; Magnetic sensors; Micromechanical devices; Paper technology; Temperature sensors; Wireless sensor networks;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373452
