Title :
Foreword integrated systems on a chip
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
ISSCC digest foreword; Circuit testing; Digital circuits; Image converters; Integrated circuit technology; Microprocessors; Reflection; Semiconductor memory; Solid state circuit design; Solid state circuits; System testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156084
