Title :
Digital Circuit Innovations
Author :
Blaauw, David ; Konstandinidis, Georgios
Author_Institution :
University of Michigan, Ann Arbor, MI
Keywords :
CMOS logic circuits; Circuit testing; Delay; Digital circuits; Energy consumption; Monitoring; Semiconductor device measurement; Sun; Technological innovation; Timing;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373461
