• DocumentCode
    2870054
  • Title

    True Random Number Generator with a Metastability-Based Quality Control

  • Author

    Tokunaga, Carlos ; Blaauw, David ; Mudge, Trevor

  • Author_Institution
    Michigan Univ., Ann Arbor, MI
  • fYear
    2007
  • fDate
    11-15 Feb. 2007
  • Firstpage
    404
  • Lastpage
    611
  • Abstract
    A proposed metastability-based true random number generator (TRNG) achieves high entropy and passes NIST randomness test by grading the randomness of each metastable event through the measurement of its resolution time, regardless of the output bit value. This allows the system to determine the original noise level at the time of metastability and to tune itself for maximum randomness. A fully integrated 0.036mm2 TRNG is fabricated and measured in a 0.13mum technology.
  • Keywords
    quality control; random number generation; 0.13 micron; metastability-based quality control; randomness test; true random number generator; Control systems; Counting circuits; Filtering; Latches; Metastasis; Quality control; Random number generation; Signal resolution; Statistics; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0853-9
  • Electronic_ISBN
    0193-6530
  • Type

    conf

  • DOI
    10.1109/ISSCC.2007.373465
  • Filename
    4242436