DocumentCode
2870101
Title
High data rate signal integrity in micron-scale silicon ring resonators
Author
Small, Benjamin A. ; Lee, Benjamin G. ; Bergman, Keren ; Xu, Qianfan ; Shakya, Jagat ; Lipson, Michal
Author_Institution
Dept. of Electr. Eng., Columbia Univ., New York, NY
fYear
2006
fDate
21-26 May 2006
Firstpage
1
Lastpage
2
Abstract
A ring resonator with a FWHM of 0.095 nm (11.6 GHz) is experimentally measured to have a 1.4 dB power penalty for a 10 Gbps NRZ OOK signal, due to spectral distortions. Numerical simulations match these results.
Keywords
amplitude shift keying; numerical analysis; resonators; silicon; NRZ OOK signal; Si; bit rate 10 Gbit/s; high data rate signal integrity; micron-scale silicon ring resonators; numerical simulations; spectral distortions; Attenuation; Bit error rate; Degradation; Frequency; Optical distortion; Optical ring resonators; Optical signal processing; Power measurement; Resonance; Silicon; (120.7000) Transmission; (230.3990) Microstructure devices; (230.5750) Resonators;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location
Long Beach, CA
Print_ISBN
978-1-55752-813-1
Electronic_ISBN
978-1-55752-813-1
Type
conf
DOI
10.1109/CLEO.2006.4628160
Filename
4628160
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