Title :
AN ACCURATE BRIDGING FAULT TEST PATTERN GENERATOR
Author :
Millman, Steven D. ; Garvey, James P., Sr.
Keywords :
CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Monitoring; Semiconductor device modeling; Strontium; Test pattern generators; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519701
