DocumentCode
28702
Title
A 70 dB DR 10 b 0-to-80 MS/s Current-Integrating SAR ADC With Adaptive Dynamic Range
Author
Malki, Badr ; Yamamoto, Takayuki ; Verbruggen, Bob ; Wambacq, Piet ; Craninckx, Jan
Author_Institution
IMEC, Leuven, Belgium
Volume
49
Issue
5
fYear
2014
fDate
May-14
Firstpage
1173
Lastpage
1183
Abstract
A charge-domain SAR ADC is presented which integrates the current of a variable-gain transconductor on its sampling capacitor, rather than being driven by a power hungry voltage buffer. The sampling circuit uses nonlinear MOS capacitors as sampling capacitor for passive amplification to relax the comparator noise requirements without compromising linearity. The prototype in 40 nm low power CMOS process consists of a 1.1-17.6 mS transconductor, combined with a 10 b 0-80 MS/s charge-sharing SAR ADC. It achieves 70 dB DR while consuming less than 5.45 mA from a 1.1 V supply and achieves a peak SNDR of 56.85 dB at 40 MS/s.
Keywords
CMOS integrated circuits; MOS capacitors; analogue-digital conversion; low-power electronics; adaptive dynamic range; charge-domain SAR ADC; comparator noise requirements; conductance 1.1 mS to 17.6 mS; current-integrating SAR ADC; nonlinear MOS capacitors; passive amplification; sampling capacitor; sampling circuit; size 40 nm; successive approximation register; variable-gain transconductor; voltage 1.1 V; word length 10 bit; Capacitance; Capacitors; Computer architecture; Linearity; Microprocessors; Noise; Switches; ADC driver; Charge-based ADC; SAR; VGA; charge-sharing; passive amplification; sinc filtering; wireless receiver;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2014.2309086
Filename
6763107
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