Title :
The LSI data acquisition peripheral of the future
Author :
Schoeff, J. ; Solomon, Jeffrey
Author_Institution :
Advanced Micro Devices, Inc., Sunnyvale, CA, USA
Abstract :
Performance limits, unique to large scale MOS and bipolar data acquisition ICs, will be examined. Comparisons between competing partitioning methods for LSI-based analog/ microcomputer systems will be made.
Keywords :
Analog integrated circuits; Complexity theory; Data acquisition; Digital integrated circuits; Fabrication; Large scale integration; Microprocessors; PROM; Protocols; Read only memory;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156105
