DocumentCode
2870246
Title
The LSI data acquisition peripheral of the future
Author
Schoeff, J. ; Solomon, Jeffrey
Author_Institution
Advanced Micro Devices, Inc., Sunnyvale, CA, USA
Volume
XXIII
fYear
1980
fDate
13-15 Feb. 1980
Firstpage
188
Lastpage
188
Abstract
Performance limits, unique to large scale MOS and bipolar data acquisition ICs, will be examined. Comparisons between competing partitioning methods for LSI-based analog/ microcomputer systems will be made.
Keywords
Analog integrated circuits; Complexity theory; Data acquisition; Digital integrated circuits; Fabrication; Large scale integration; Microprocessors; PROM; Protocols; Read only memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1980.1156105
Filename
1156105
Link To Document