DocumentCode
2870286
Title
Row readout in CID imaging
Author
Brown, Dean ; Burke, H. ; Ghezzo, M. ; McConnelee, P. ; Michon, G. ; Vogelsong, T.
Author_Institution
General Electric Research/Development Center, Schenectady, NY, USA
Volume
XXIII
fYear
1980
fDate
13-15 Feb. 1980
Firstpage
28
Lastpage
29
Abstract
A readout technique, allowing high speed readout, while lowering the fixed pattern noise and temporal noise, will be described. Method uses a thin polysilicon (< 1000 Å) upper electrode for high spectral sensitivity, strapped with a 2μ wide aluminum line for sensing.
Keywords
Aluminum; Annealing; Cameras; Electrodes; Frequency; High-resolution imaging; Noise figure; Pulse amplifiers; Silicon; TV;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1980.1156108
Filename
1156108
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