Title :
Row readout in CID imaging
Author :
Brown, Dean ; Burke, H. ; Ghezzo, M. ; McConnelee, P. ; Michon, G. ; Vogelsong, T.
Author_Institution :
General Electric Research/Development Center, Schenectady, NY, USA
Abstract :
A readout technique, allowing high speed readout, while lowering the fixed pattern noise and temporal noise, will be described. Method uses a thin polysilicon (< 1000 Å) upper electrode for high spectral sensitivity, strapped with a 2μ wide aluminum line for sensing.
Keywords :
Aluminum; Annealing; Cameras; Electrodes; Frequency; High-resolution imaging; Noise figure; Pulse amplifiers; Silicon; TV;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156108
