DocumentCode :
2870405
Title :
A DENSELY INTEGRATED HIGH PERFORMANCE CMOS TESTER
Author :
Lesmeister, Gary
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
426
Keywords :
CMOS process; CMOS technology; Circuit testing; Design methodology; Integrated circuit technology; Integrated circuit testing; Phase locked loops; System testing; Temperature distribution; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-8186-9156-5
Type :
conf
DOI :
10.1109/TEST.1991.519703
Filename :
519703
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2870405
