DRAM and eRAM

Author

Brox, Martin ; Kajigaya, Kazuhiko

Author_Institution

Qimonda, Neubiberg, Germany

fYear

2007

fDate

11-15 Feb. 2007

Firstpage

484

Lastpage

485

Keywords

Bandwidth; Clocks; Computer applications; Costs; Flexible printed circuits; Fuses; Games; Random access memory; Redundancy; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International

Conference_Location

San Francisco, CA, USA

ISSN

0193-6530

Print_ISBN

1-4244-0853-9

Electronic_ISBN

0193-6530

Type

DOI

10.1109/ISSCC.2007.373505

Filename

4242476

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