DocumentCode
2870815
Title
Detection and Classification of Wood Defects by ANN
Author
Mu, Hongbo ; Li, Li ; Yu, Lei ; Zhang, Mingming ; Qi, Dawei
Author_Institution
Dept. of Phys., Northeast Forestry Univ., Harbin
fYear
2006
fDate
25-28 June 2006
Firstpage
2235
Lastpage
2240
Abstract
X-ray as a method of measurement was adopted to detect wood defects nondestructively. Due to the intensity of x-ray that crosses the object changes, defects in wood were detected by the difference of X-ray absorption parameter, and therefore it used computer to process and analyze the image. On the basis of image processing of nondestructive testing and characteristic construction, defects mathematic model were established by using characteristic parameters. According to signal characters of nondestructive testing, artificial neural networks were set up. Meanwhile, adopt BP networks model to recognize all characteristic parameters, which reflected characters of wood defects. BP networks used coefficient matrix of each unit, including input layer, intermediate layer (concealed layer) and output layer, to get the model of input vector and finish networks recognition through the networks learning. The test results show that the method is very successful for detection and classification of wood defects
Keywords
X-ray absorption; X-ray detection; X-ray imaging; artificial intelligence; image processing; neural nets; nondestructive testing; production engineering computing; wood processing; ANN; BP networks; X-ray absorption parameter; artificial neural networks; defects mathematic model; image processing; nondestructive testing; wood defects; Artificial neural networks; Electromagnetic wave absorption; Image analysis; Image processing; Mathematics; Nondestructive testing; Object detection; X-ray detection; X-ray detectors; X-ray imaging; Artificial neural networks; Classification; Image processing; Nondestructive testing; Wood defects;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronics and Automation, Proceedings of the 2006 IEEE International Conference on
Conference_Location
Luoyang, Henan
Print_ISBN
1-4244-0465-7
Electronic_ISBN
1-4244-0466-5
Type
conf
DOI
10.1109/ICMA.2006.257659
Filename
4026445
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