• DocumentCode
    2870908
  • Title

    A MOS Image Sensor with Microlenses Built by Sub-Wavelength Patterning

  • Author

    Toshikiyo, Kimiaki ; Yogo, Takanori ; Ishii, Motonori ; Yamanaka, Kazuhiko ; Matsuno, Toshinobu ; Onozawa, Kazutoshi ; Yamaguchi, Takumi

  • Author_Institution
    Matsushita Electr. Ind., Kyoto
  • fYear
    2007
  • fDate
    11-15 Feb. 2007
  • Firstpage
    514
  • Lastpage
    515
  • Abstract
    A MOS image sensor has digital-microlenses implemented by sub-wavelength patterning of concentric SiO2 ring walls. The sensitivity at the periphery of the imager is 3000e-/1x-s. In comparison, the sensitivity at the periphery of a conventional imager is 1300e/1x-s. Thus, extremely uniform brightness throughout the reproduced image is demonstrated even with an angle of incidence > 45deg.
  • Keywords
    MOS integrated circuits; image sensors; microlenses; silicon compounds; MOS image sensor; SiO2; digital-microlenses; ring walls; sub-wavelength patterning; Digital cameras; Image sensors; Lenses; Microoptics; Optical arrays; Optical refraction; Optical sensors; Pixel; Refractive index; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    1-4244-0853-9
  • Electronic_ISBN
    0193-6530
  • Type

    conf

  • DOI
    10.1109/ISSCC.2007.373520
  • Filename
    4242491
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2870908