Title :
A self-testing ROM device
Author :
Theus, U. ; Leutiger, H.
Author_Institution :
Technical University of Aachen, Aachen, Germany
Abstract :
A self-testing 1Kb ROM affording in the test mode functional conversion of peripheral subcircuits into test aids on the chip will be reported. Error coverage is better than 99.6% and area overhead is 15%.
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Counting circuits; Latches; Microprocessors; Production; Read only memory; Switches; Test pattern generators;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1981.1156147
