Title :
Thermal profiling of photonic integrated circuits by thermoreflectance microscopy
Author :
Farzaneh, M. ; Luerssen, D. ; Hudgings, Janice A.
Author_Institution :
Dept. of Phys., Mount Holyoke Coll., South Hadley, MA
Abstract :
We demonstrate the use of thermoreflectance imaging for wafer-scale testing of photonic integrated circuits. The technique is used to identify damaged devices in a dysfunctional photonic circuit comprised of cascaded semiconductor optical amplifiers.
Keywords :
infrared imaging; integrated optics; optical microscopy; optical testing; semiconductor optical amplifiers; thermoreflectance; cascaded semiconductor optical amplifiers; dysfunctional photonic circuit; photonic integrated circuits; thermal profiling; thermoreflectance imaging; thermoreflectance microscopy; wafer-scale testing; Integrated optics; Microscopy; Optical devices; Optical interferometry; Optical pumping; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance imaging; (000.2170) Equipment and techniques; (110.6820) Thermal imaging; (120.6780) Temperature; (130.3120) Integrated optics devices;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628240
