مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2871650

Title :

CAN REDUNDANCY ENHANCE TESTABILITY?

Author :

Krasniewski, Andrzej

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

483

Keywords :

Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Logic circuits; Logic testing; Minimization; Redundancy; Test pattern generators;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519710

Filename :

519710

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2871650