Title :
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Author :
Ferguson, F. Joel ; Larrabee, Tracy
Keywords :
Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Costs; Electrical fault detection; Fault detection; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519711
