DocumentCode :
2871807
Title :
Predictive modeling of the fatigue phenomenon for polycrystalline structural layers
Author :
Millet, Olivier ; Bertrand, Pierre ; Legrand, Bernard ; Collard, Dominique ; Buchaillot, Lionel
Author_Institution :
Inst. d´´Electron., de Micro-Electron. et de Nanotechnol., CNRS, Villeneuve d´´Ascq, France
fYear :
2004
fDate :
2004
Firstpage :
145
Lastpage :
148
Abstract :
This paper deals with the fatigue phenomenon of microstructures which is scanned through the dynamic response of polycrystalline structural layers during operation. A predictive modeling of the fatigue phenomenon has been determined based on experimental results obtained by using M-Tests. First, we present the fabrication process and simulation results. Next, cyclic actuation has been performed and two different characterization methods have been used: pull-in voltage measurement and mechanical determination of the stiffness with an Atomic Force Microscope. A description of the fatigue phenomenon is proposed and, from experimental results, a predictive modeling has been built and compared to new characterization results in order to validate it. This modeling allows predicting the evolution of clamped-clamped beam stiffness vs. the number of operations.
Keywords :
atomic force microscopy; crystal microstructure; elastic constants; elemental semiconductors; fatigue; microactuators; micromachining; semiconductor device models; semiconductor thin films; silicon; Si; atomic force microscopy; clamped-clamped beam stiffness; cyclic actuation; fatigue properties; microstructures; polycrystalline structural layers; predictive modeling; voltage measurement; Atomic force microscopy; Electrodes; Electrostatics; Fabrication; Fatigue; Performance evaluation; Predictive models; Stress; Testing; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
Print_ISBN :
0-7803-8265-X
Type :
conf
DOI :
10.1109/MEMS.2004.1290543
Filename :
1290543
Link To Document :
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