DocumentCode
2871969
Title
IC DEFECTS-BASED TESTABILITY ANALYSIS
Author
Sousa, J.J.T. ; Gonçalves, F.M. ; Teixeira, J.P.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
500
Keywords
Circuit faults; Circuit testing; Design for testability; Digital circuits; Electrical fault detection; Fault detection; Integrated circuit layout; Integrated circuit testing; Logic testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519712
Filename
519712
Link To Document