Title :
IC DEFECTS-BASED TESTABILITY ANALYSIS
Author :
Sousa, J.J.T. ; Gonçalves, F.M. ; Teixeira, J.P.
Keywords :
Circuit faults; Circuit testing; Design for testability; Digital circuits; Electrical fault detection; Fault detection; Integrated circuit layout; Integrated circuit testing; Logic testing; Voltage;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519712
