Title :
High-speed split-emitter I2L/MTL memory cell
Author :
Wiedmann, S. ; Tang, Dong
Author_Institution :
IBM Research Center, Yorktown Heights, NY, USA
Abstract :
This paper will report on the development of a split-emitter cell to overcome the problem of small sense signals in injector-sensed I2L/MTL memories. Sense signals > 100mV at read currents ∼ 0.3mA were achieved experimentally, resulting in potentially a 2x reduction in chip access time.
Keywords :
Bipolar transistors; Circuit testing; Current supplies; Degradation; Electron devices; Inverters; Parasitic capacitance; Resistors; Signal design; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1981.1156211
