DocumentCode
2872186
Title
An Online Automatic Method for Correction of Piezoelectric Scanner
Author
Li, Yingzi ; Qian, Jianqiang ; Liu, Wenliang ; Li, Yuan ; Hua, Baocheng ; Yang, Yong
Author_Institution
Dept. of Phys., Beihang Univ., Beijing, China
fYear
2009
fDate
11-13 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
A novel online auto-correction method is proposed in this paper, according to the nonlinearity and hysteresis of atomic force microscope (AFM) piezoelectric ceramics scanner. In this method, an automatic positioning algorithm is invoked to get the same characteristic points from the forward and backward scanning line; these points are used to calculate the distortion factors to realized image correction. Mathematical derivation of the correction principle is given, and automatic positioning algorithm based on successive template comparison is introduced. Finally situations may cause invalidation of the method are discussed and solutions are given. Practice proves that the method is effective and can be applied in AFM automation.
Keywords
atomic force microscopy; piezoceramics; piezoelectric devices; atomic force microscope; automatic positioning algorithm; distortion factor; image correction; online autocorrection method; piezoelectric ceramic scanner; Atomic force microscopy; Automation; Ceramics; Creep; Feedback; Hardware; Hysteresis; Instruments; Optical distortion; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-4507-3
Electronic_ISBN
978-1-4244-4507-3
Type
conf
DOI
10.1109/CISE.2009.5366729
Filename
5366729
Link To Document