• DocumentCode
    2872186
  • Title

    An Online Automatic Method for Correction of Piezoelectric Scanner

  • Author

    Li, Yingzi ; Qian, Jianqiang ; Liu, Wenliang ; Li, Yuan ; Hua, Baocheng ; Yang, Yong

  • Author_Institution
    Dept. of Phys., Beihang Univ., Beijing, China
  • fYear
    2009
  • fDate
    11-13 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A novel online auto-correction method is proposed in this paper, according to the nonlinearity and hysteresis of atomic force microscope (AFM) piezoelectric ceramics scanner. In this method, an automatic positioning algorithm is invoked to get the same characteristic points from the forward and backward scanning line; these points are used to calculate the distortion factors to realized image correction. Mathematical derivation of the correction principle is given, and automatic positioning algorithm based on successive template comparison is introduced. Finally situations may cause invalidation of the method are discussed and solutions are given. Practice proves that the method is effective and can be applied in AFM automation.
  • Keywords
    atomic force microscopy; piezoceramics; piezoelectric devices; atomic force microscope; automatic positioning algorithm; distortion factor; image correction; online autocorrection method; piezoelectric ceramic scanner; Atomic force microscopy; Automation; Ceramics; Creep; Feedback; Hardware; Hysteresis; Instruments; Optical distortion; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-4507-3
  • Electronic_ISBN
    978-1-4244-4507-3
  • Type

    conf

  • DOI
    10.1109/CISE.2009.5366729
  • Filename
    5366729