DocumentCode :
2872267
Title :
Analytical interval assessment method of voltage sag frequency considering the satisfaction degree of sensitive customer
Author :
Xu, Wei ; Wang, Ying ; Xiao, Xianyong
Author_Institution :
Platform Technol. Res. Inst., RMIT Univ., Melbourne, VIC, Australia
fYear :
2011
fDate :
7-10 Nov. 2011
Firstpage :
837
Lastpage :
842
Abstract :
Meeting customer satisfaction is an essential responsibility of power and utilities companies. Considering the property of customer´s satisfaction degree, an analytical interval assessment method of voltage sag frequency is proposed. The customer satisfaction degree is presented by interval data corresponding to the voltage tolerance of the tested equipment installed at the customer side. Based on the determination function derived from the relationship between the voltage magnitude and the length of fault line in the power supply system, the critical fault positions are determined using an analytical iterative algorithm. By studying the variation in the satisfaction degree within a given interval range, the interval sag frequency is calculated. Moreover, the quantitative sag frequency is determined with the help of the interval sag frequency. After a comprehensive analysis, the proposed method is applied to a five-bus system and IEEE 30-bus reliability test system (RTS). A myriad of experiments based on different methods indicate that the proposed method is very credible and practical for the application.
Keywords :
IEEE standards; customer satisfaction; iterative methods; power supply quality; IEEE 30-bus RTS; IEEE 30-bus reliability test system; analytical interval assessment method; analytical iterative algorithm; fault line; five-bus system; interval assessment method; interval data; interval sag frequency; power company; power supply system; quantitative sag frequency; sensitive customer satisfaction degree; utility company; voltage magnitude; voltage sag frequency; voltage tolerance; Circuit faults; Customer satisfaction; Joining processes; Power systems; Threshold voltage; Uncertainty; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 2011 - 37th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Melbourne, VIC
ISSN :
1553-572X
Print_ISBN :
978-1-61284-969-0
Type :
conf
DOI :
10.1109/IECON.2011.6119419
Filename :
6119419
Link To Document :
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