• DocumentCode
    2872615
  • Title

    Cost-effective yield improvement in fault-tolerant VLSI memory

  • Author

    Bindels, J. ; Chlipala, J. ; Fischer, Fabian ; Mantz, T. ; Nelson, Robert ; Smith, Ross

  • Author_Institution
    Bell Laboratories, Allentown, PA, USA
  • Volume
    XXIV
  • fYear
    1981
  • fDate
    18-20 Feb. 1981
  • Firstpage
    82
  • Lastpage
    83
  • Abstract
    This paper will discuss the use of laser programming of redundant circuits in VLSI memories, For a 64K dynamic RAM, the resulting yield improvement factors have been found to range from 5 to 30.
  • Keywords
    Circuit testing; Error correction; Fault tolerance; Large scale integration; Laser beam cutting; Laser modes; Production systems; Random access memory; Throughput; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1981.1156242
  • Filename
    1156242
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2872615