Title :
Cost-effective yield improvement in fault-tolerant VLSI memory
Author :
Bindels, J. ; Chlipala, J. ; Fischer, Fabian ; Mantz, T. ; Nelson, Robert ; Smith, Ross
Author_Institution :
Bell Laboratories, Allentown, PA, USA
Abstract :
This paper will discuss the use of laser programming of redundant circuits in VLSI memories, For a 64K dynamic RAM, the resulting yield improvement factors have been found to range from 5 to 30.
Keywords :
Circuit testing; Error correction; Fault tolerance; Large scale integration; Laser beam cutting; Laser modes; Production systems; Random access memory; Throughput; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1981.1156242
