DocumentCode
2872877
Title
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM
Author
Oberle, H.-D. ; Muhmenthaler, P.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
548
Keywords
Buffer storage; Capacitors; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic arrays; Production; Random access memory; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519717
Filename
519717
Link To Document