Title :
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM
Author :
Oberle, H.-D. ; Muhmenthaler, P.
Keywords :
Buffer storage; Capacitors; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic arrays; Production; Random access memory; Semiconductor device testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519717
