DocumentCode :
2872884
Title :
500 MHz Delay Locked Loop Based 128-bin, 256 ns Deep Analog Memory ASIC "Anusmriti"
Author :
Sukhwani, Menka ; Chandratre, V.B. ; Thomas, Megha ; Pithawa, C.K. ; Sharda, Vangmayee
Author_Institution :
Centre for Micro-Electron., Bhabha Atomic Res. Centre, Mumbai, India
fYear :
2011
fDate :
4-6 July 2011
Firstpage :
72
Lastpage :
77
Abstract :
A 128-bin, 256 ns deep switched capacitor analog waveform sampling memory ASIC "Anusmriti" is designed using 500 MHz delay lock loop (DLL) in 0.7 μm mixed CMOS process for sampling and storing the randomly occurring fast exponential signals. The stored memory samples can be read and digitized subsequently at lower rate thereby relieving the need of high speed digitization. The Anusmriti ASIC is designed specifically for pulse profile analysis of fast single shot events, occurring typically in High Energy Physics, Astronomy and laser/accelerator based experiments without using high frequency sampling clocks. This design incorporates 500 MHz delay locked loop, locked using a low frequency reference clock, so as to ensure good timing accuracy of each sampling interval at all the times. The Anusmriti ASIC has input dynamic range of 2 V and input capacitance of 64 pF. This full custom ASIC has been tested for equivalent sampling rate of 500 MHz with analog serial readout at 1 MHz. The ASIC features small bin spread across the memory depth. This paper describes design approach, trade-offs and test results of the Anusmriti ASIC. This ASIC occupies a die area of 5 mm by 3.5 mm.
Keywords :
CMOS memory circuits; analogue storage; application specific integrated circuits; delay lock loops; switched capacitor networks; Anusmriti deep analog memory ASIC; analog serial readout; capacitance 64 pF; deep switched capacitor analog waveform sampling memory; delay locked loop; fast exponential signals; fast single shot events; frequency 1 MHz; frequency 500 MHz; high energy physics; laser-accelerator; low frequency reference clock; mixed CMOS process; pulse profile analysis; size 0.7 mum; time 256 ns; voltage 2 V; Analog memory; Application specific integrated circuits; Calibration; Capacitors; Switches; Switching circuits; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location :
Chennai
ISSN :
2159-3469
Print_ISBN :
978-1-4577-0803-9
Electronic_ISBN :
2159-3469
Type :
conf
DOI :
10.1109/ISVLSI.2011.56
Filename :
5992462
Link To Document :
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