DocumentCode :
287302
Title :
Problems related to power semiconductor device modelling
Author :
Kuzmin, V.A. ; Mnatsakanov, T.T. ; Rostovtsev, I.L. ; Yurkov, S.N.
Author_Institution :
All-Russian Electrotech. Inst., Moscow, Russia
fYear :
1993
fDate :
13-16 Sep 1993
Firstpage :
113
Abstract :
Numerical programs intended for power semiconductor device design and research are described. These programs are based on original models of device characteristics specially adjusted for power semiconductor device simulation. The programs are based on an original formulation of charge carrier transport equations. These new transport equations prove to be necessary for correct treatment of nonlinear physical phenomena which arise under high injection conditions. The programs take into account the constructive peculiarities of devices, i.e. type of device construction (pressed, alloyed, etc.), thickness and thermophysical parameters of layers, the contact thermal resistance (for devices with pressed construction), the existence of the auxiliary structure in thyristors and the complicated topology of the gate electrode
Keywords :
electronic engineering computing; power electronics; semiconductor device models; semiconductor diodes; thyristors; breakover voltage model; charge carrier transport equations; contact thermal resistance; device construction; device simulation; gate electrode topology; gate trigger models; high injection conditions; layer thickness; nonlinear physical phenomena; numerical programs; power semiconductor device modelling; surge current model; technological shunting model; thermophysical parameters; thyristors;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Power Electronics and Applications, 1993., Fifth European Conference on
Conference_Location :
Brighton
Type :
conf
Filename :
265015
Link To Document :
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