• DocumentCode
    287302
  • Title

    Problems related to power semiconductor device modelling

  • Author

    Kuzmin, V.A. ; Mnatsakanov, T.T. ; Rostovtsev, I.L. ; Yurkov, S.N.

  • Author_Institution
    All-Russian Electrotech. Inst., Moscow, Russia
  • fYear
    1993
  • fDate
    13-16 Sep 1993
  • Firstpage
    113
  • Abstract
    Numerical programs intended for power semiconductor device design and research are described. These programs are based on original models of device characteristics specially adjusted for power semiconductor device simulation. The programs are based on an original formulation of charge carrier transport equations. These new transport equations prove to be necessary for correct treatment of nonlinear physical phenomena which arise under high injection conditions. The programs take into account the constructive peculiarities of devices, i.e. type of device construction (pressed, alloyed, etc.), thickness and thermophysical parameters of layers, the contact thermal resistance (for devices with pressed construction), the existence of the auxiliary structure in thyristors and the complicated topology of the gate electrode
  • Keywords
    electronic engineering computing; power electronics; semiconductor device models; semiconductor diodes; thyristors; breakover voltage model; charge carrier transport equations; contact thermal resistance; device construction; device simulation; gate electrode topology; gate trigger models; high injection conditions; layer thickness; nonlinear physical phenomena; numerical programs; power semiconductor device modelling; surge current model; technological shunting model; thermophysical parameters; thyristors;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics and Applications, 1993., Fifth European Conference on
  • Conference_Location
    Brighton
  • Type

    conf

  • Filename
    265015