• DocumentCode
    2873077
  • Title

    Self-testing VLSI

  • Author

    Heckelman, R. ; Bhavsar, D.

  • Author_Institution
    General Electric Co., Syracuse NY, USA
  • Volume
    XXIV
  • fYear
    1981
  • fDate
    18-20 Feb. 1981
  • Firstpage
    174
  • Lastpage
    175
  • Abstract
    A library of self-testing LSI cells for both on-line and off-line testing will be described, citing a 16×16b array multiplier with 9300 CMOS transistors as an example.
  • Keywords
    Automatic testing; Built-in self-test; Clocks; Cost function; Hardware; Logic testing; Pipelines; Registers; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1981 IEEE International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1981.1156276
  • Filename
    1156276
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2873077