DocumentCode
2873110
Title
An Efficient Design Technique for High Performance Dynamic Feedthrough Logic with Enhanced Noise Tolerance
Author
Parashar, Shashank ; Kumar, Chaudhry Indra ; Pattanaik, Manisha
Author_Institution
VLSI Design Lab., ABV-IIITM, Gwalior, India
fYear
2011
fDate
4-6 July 2011
Firstpage
49
Lastpage
53
Abstract
FTL improves the performance of arithmetic circuits, with a very long logic depth, while reducing the power dissipation, when compared with standard CMOS circuits. The feed through logic (FTL) allows for a partial evaluation in a computational block before its input signals are valid, and does a quick final evaluation as soon as the inputs arrive. As the supply voltage is scaling down, the circuit noise immunity is being reduced. In case of FTL its speed is very good but noise immunity is poor. So FTL design will not be a good choice for industrial application in deep submicron region. In this work, a new design approach is implemented using FTL concept for high performance dynamic CMOS logic with high noise immunity. A 2 input AND gate has been designed using the improved FTL technique. Further a comparison analysis has been carried out by realizing and simulating the logic circuits in 180nm technology at supply voltage of 1.8V. At 180nm technology the ANTE & Energy normalized ANTE of proposed technique improved by 2.24X & 2.57X over conventional FTL and power dissipation is reduced by 32% over conventional FTL Technique.
Keywords
CMOS logic circuits; logic design; logic gates; AND gate; FTL design; arithmetic circuits; circuit noise immunity; dynamic CMOS logic; enhanced noise tolerance; feedthrough logic; high performance dynamic feedthrough logic; power dissipation; size 180 nm; voltage 1.8 V; CMOS integrated circuits; Delay; Logic circuits; Logic gates; Noise; Power dissipation; Transistors; ANTE; CMOS Dynamic Logic Circuits; Feedthrough logic (FTL); Noise Tolerance;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location
Chennai
ISSN
2159-3469
Print_ISBN
978-1-4577-0803-9
Electronic_ISBN
2159-3469
Type
conf
DOI
10.1109/ISVLSI.2011.31
Filename
5992478
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