Title :
FAULT MODELING FOR THE TESTING OF MIXED INTEGRATED CIRCUITS
Author :
Meixner, Anne ; Maly, Wojciech
Keywords :
Analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Digital integrated circuits; Integrated circuit modeling; Integrated circuit testing; Mathematical model; Semiconductor device modeling; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519719
