DocumentCode
2873216
Title
Design of Unique and Reliable Physically Unclonable Functions Based on Current Starved Inverter Chain
Author
Kumar, Raghavan ; Patil, Vinay C. ; Kundu, Sandip
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
fYear
2011
fDate
4-6 July 2011
Firstpage
224
Lastpage
229
Abstract
Physically Unclonable Functions (PUFs) are a class of circuits, which are used to map a set of challenges to responses relying upon the intrinsic process variations in interconnects and transistors. The PUFs are expected to produce unique and repeatable responses. In an arbiter based PUF, the uniqueness is contingent upon relative path delays. Reliability or repeatability of responses depends on circuit sensitivity to environmental parameters such as temperature. In this paper, we propose an arbiter based PUF circuit built on current starved inverters, whose drain currents are set by local current mirrors. This circuit amplifies process variations that result in greater uniqueness when compared against a simple inverter chain. The final 64-stage PUF implemented in 45nm CMOS technology requires only 256 current-starved inverter gates. In experimental results we demonstrate superior performance of proposed circuit in uniqueness and reliability.
Keywords
CMOS digital integrated circuits; current mirrors; delays; integrated circuit interconnections; integrated circuit reliability; invertors; transistors; CMOS technology; PUF; circuit sensitivity; current mirror; current starved inverter gate chain; drain current; environmental parameter; interconnect; intrinsic process variation; physically unclonable function; relative path delay; reliability; size 45 nm; transistor; Delay; Integrated circuit reliability; Inverters; Mirrors; Noise; Reliability engineering; Current mirrors; Physically Unclonable Functions (PUFs); RFIDs; Uniqueness; hardware security;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location
Chennai
ISSN
2159-3469
Print_ISBN
978-1-4577-0803-9
Electronic_ISBN
2159-3469
Type
conf
DOI
10.1109/ISVLSI.2011.82
Filename
5992484
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