• DocumentCode
    2873216
  • Title

    Design of Unique and Reliable Physically Unclonable Functions Based on Current Starved Inverter Chain

  • Author

    Kumar, Raghavan ; Patil, Vinay C. ; Kundu, Sandip

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
  • fYear
    2011
  • fDate
    4-6 July 2011
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    Physically Unclonable Functions (PUFs) are a class of circuits, which are used to map a set of challenges to responses relying upon the intrinsic process variations in interconnects and transistors. The PUFs are expected to produce unique and repeatable responses. In an arbiter based PUF, the uniqueness is contingent upon relative path delays. Reliability or repeatability of responses depends on circuit sensitivity to environmental parameters such as temperature. In this paper, we propose an arbiter based PUF circuit built on current starved inverters, whose drain currents are set by local current mirrors. This circuit amplifies process variations that result in greater uniqueness when compared against a simple inverter chain. The final 64-stage PUF implemented in 45nm CMOS technology requires only 256 current-starved inverter gates. In experimental results we demonstrate superior performance of proposed circuit in uniqueness and reliability.
  • Keywords
    CMOS digital integrated circuits; current mirrors; delays; integrated circuit interconnections; integrated circuit reliability; invertors; transistors; CMOS technology; PUF; circuit sensitivity; current mirror; current starved inverter gate chain; drain current; environmental parameter; interconnect; intrinsic process variation; physically unclonable function; relative path delay; reliability; size 45 nm; transistor; Delay; Integrated circuit reliability; Inverters; Mirrors; Noise; Reliability engineering; Current mirrors; Physically Unclonable Functions (PUFs); RFIDs; Uniqueness; hardware security;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Chennai
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4577-0803-9
  • Electronic_ISBN
    2159-3469
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2011.82
  • Filename
    5992484