DocumentCode :
2873216
Title :
Design of Unique and Reliable Physically Unclonable Functions Based on Current Starved Inverter Chain
Author :
Kumar, Raghavan ; Patil, Vinay C. ; Kundu, Sandip
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
fYear :
2011
fDate :
4-6 July 2011
Firstpage :
224
Lastpage :
229
Abstract :
Physically Unclonable Functions (PUFs) are a class of circuits, which are used to map a set of challenges to responses relying upon the intrinsic process variations in interconnects and transistors. The PUFs are expected to produce unique and repeatable responses. In an arbiter based PUF, the uniqueness is contingent upon relative path delays. Reliability or repeatability of responses depends on circuit sensitivity to environmental parameters such as temperature. In this paper, we propose an arbiter based PUF circuit built on current starved inverters, whose drain currents are set by local current mirrors. This circuit amplifies process variations that result in greater uniqueness when compared against a simple inverter chain. The final 64-stage PUF implemented in 45nm CMOS technology requires only 256 current-starved inverter gates. In experimental results we demonstrate superior performance of proposed circuit in uniqueness and reliability.
Keywords :
CMOS digital integrated circuits; current mirrors; delays; integrated circuit interconnections; integrated circuit reliability; invertors; transistors; CMOS technology; PUF; circuit sensitivity; current mirror; current starved inverter gate chain; drain current; environmental parameter; interconnect; intrinsic process variation; physically unclonable function; relative path delay; reliability; size 45 nm; transistor; Delay; Integrated circuit reliability; Inverters; Mirrors; Noise; Reliability engineering; Current mirrors; Physically Unclonable Functions (PUFs); RFIDs; Uniqueness; hardware security;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location :
Chennai
ISSN :
2159-3469
Print_ISBN :
978-1-4577-0803-9
Electronic_ISBN :
2159-3469
Type :
conf
DOI :
10.1109/ISVLSI.2011.82
Filename :
5992484
Link To Document :
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