Title :
A self-consistent approach to substrate current simulation in submicron MOSFETs
Author :
Lydia L.So ; Kan, Edwin ; Yu, Zhiping ; Dutton, Robert W.
Author_Institution :
Stanford University
Keywords :
Charge carrier processes; Circuit simulation; Energy loss; Impact ionization; Lattices; MOSFETs; Poisson equations; Predictive models; Spontaneous emission; Thermal conductivity;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.771125
