• DocumentCode
    2873343
  • Title

    Characterizing the L1 Data Cache´s Vulnerability to Transient Errors in Chip-Multiprocessors

  • Author

    Tang, Li ; Wang, Shuai ; Hu, Jie ; Hu, Xiaobo Sharon

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2011
  • fDate
    4-6 July 2011
  • Firstpage
    266
  • Lastpage
    271
  • Abstract
    With continuous technology scaling, current and next generation microprocessors are becoming more vulnerable to transient errors such as soft errors induced by energetic particle strikes. While mainstream microprocessors are employing multi-/many-core architectures targeting at high-performance parallel computing applications, the transistor/area share of on-chip caches keeps increasing. As cache memories being the major victim of soft errors, it is of paramount importance to characterize on-chip cache´s vulnerability in this context for devising potential reliability optimizations, especially under the interaction with cache coherence protocols. In this work, we develop a lifetime model for the private L1 data cache in chip-multiprocessors (CMPs), which is based on the cache activities and the states of cache lines. This lifetime model is then applied to characterize and predict cache´s vulnerability trend in CMPs. Our experimental evaluation shows that cache vulnerable phases due to remote accesses increase dramatically as the number of processor cores increases. Based on vulnerable phase analysis, we propose a protocol enhancement to prematurely invalidate cache lines in modified (M) state for minimizing the vulnerability factor due to remote reads to modified cachelines.
  • Keywords
    microprocessor chips; CMP; LI data cache vulnerability; cache memory; chip-multiprocessors; next generation microprocessors; protocol enhancement; reliability optimizations; transient errors; Benchmark testing; Coherence; Data models; Protocols; Radiation detectors; Reliability; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Chennai
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4577-0803-9
  • Electronic_ISBN
    2159-3469
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2011.23
  • Filename
    5992491