DocumentCode
2873364
Title
Session 1 device modeling and characterization [breaker page]
Author
Gywn, C.
Author_Institution
Sandia National Laboratories, Albuquerque, NM, USA
Volume
XXV
fYear
1982
fDate
10-12 Feb. 1982
Firstpage
11
Lastpage
11
Abstract
Start of the above-titled section of the conference proceedings record.
Keywords
Device modeling and characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1982.1156291
Filename
1156291
Link To Document