• DocumentCode
    2873504
  • Title

    How Knowledge Map and Personalization Affect Effectiveness of KMS in High-Tech Firms

  • Author

    Lai, Jung-Yu ; Wang, Chao-Te ; Chou, Chun-Yi

  • Author_Institution
    Nat. Chung Using Univ., Taichung
  • fYear
    2008
  • fDate
    7-10 Jan. 2008
  • Firstpage
    355
  • Lastpage
    355
  • Abstract
    The shift from a product-based to a knowledge-based economy has resulted in an increasing demand for organizations to implement knowledge management systems (KMS) at an accelerating pace. However, factors influencing the employee satisfaction with KMS, i.e. one surrogate measure of information system (IS) success/effectiveness, have seldom empirically examined by prior research, particularly how knowledge map and personalization influencing employee satisfaction with KMS. Results from a sample of 139 employees mostly from four international semiconductor manufacturing companies in the Hsin-Chu Science-based Industrial Parks in Taiwan strongly support a more comprehensive understanding in explaining employee satisfaction with KMS. The result shows KMS with a higher level of knowledge map and personalization will satisfy employees through increasing perceptions of ease of use and usefulness with KMS. Our findings could be possibly applied for investigating the related issues regarding the successful implementation of KMS for researchers and practitioners.
  • Keywords
    knowledge management; employee satisfaction; information system; knowledge management systems; knowledge map; knowledge personalization; knowledge-based economy; product-based economy; Acceleration; Chaos; Companies; Conference management; Educational institutions; Electronic commerce; Knowledge management; Management information systems; Particle measurements; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Hawaii International Conference on System Sciences, Proceedings of the 41st Annual
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1530-1605
  • Type

    conf

  • DOI
    10.1109/HICSS.2008.192
  • Filename
    4439060