Title :
Redundancy in RAMs
Author_Institution :
Advanced Micro Devices, Inc., Sunnyvale, CA, USA
Abstract :
Virtually everyone agrees that the 200%-2000% yield improvement offered by redundancy makes its acceptance a necessity for the economic viability of RAM manufacturers. But, there is considerable controversy over important short-term issues: Should the 64K DRAM have redundancy? Should fuses be programmed by electrical or laser pulses? Will redundancy have an adverse effect on testability and/or reliability? . . . These and related issues will be assessed by the panelists.
Keywords :
Engineering management; Fuses; Manufacturing; Production; Quality management; Random access memory; Read-write memory; Redundancy; Technology management; Testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1982.1156306
