DocumentCode :
2873601
Title :
Post-Synthesis Circuit Techniques for Runtime Leakage Reduction
Author :
Potluri, Seetal ; Chandrachoodan, Nitin ; Kamakoti, V.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
fYear :
2011
fDate :
4-6 July 2011
Firstpage :
319
Lastpage :
320
Abstract :
We consider the problem of reducing active mode leakage power by modifying the post-synthesis net lists of combinational logic blocks. The stacking effect is used to reduce leakage power, but instead of a separate signal one of the inputs to the gate itself is used. The approach is studied on multiplier blocks. It is found that a significant number of nets have high probabilities of being constant at 0 or 1. In specific applications such as those having high peak to average ratio, like audio and other signal processing applications, this effect is more pronounced. We show how these signals can be used to put gates to sleep, thus saving significant leakage power.
Keywords :
logic circuits; combinational logic blocks; post-synthesis circuit techniques; post-synthesis netlists; reducing active mode leakage power; runtime leakage reduction; Clocks; Delay; Integrated circuit modeling; Logic gates; Runtime; Stacking; Very large scale integration; Gate length biasing; Low Power; Post Synthesis; Runtime Leakage; Transistor Stacking Effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location :
Chennai
ISSN :
2159-3469
Print_ISBN :
978-1-4577-0803-9
Electronic_ISBN :
2159-3469
Type :
conf
DOI :
10.1109/ISVLSI.2011.24
Filename :
5992506
Link To Document :
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