A study on the dual-layers measurement model of the same biaxial anisotropic medium

Author

Xueguan, Liu ; Huipin, Guo ; Hongcheng, Yin ; Peikan, Huang

Author_Institution

Suzhou Univ., China

fYear

2004

fDate

18-21 Aug. 2004

Firstpage

715

Lastpage

718

Abstract

A dual-layers measurement model of the same biaxial anisotropic medium is presented in this paper for the reconstruction of biaxial anisotropic medium parameters. The transmission and reflection formula are derived for this model. Some calculation results are obtained which are compared with the single-layer model. The results show that the double-layers model has more choices for measurement and some parameters are more sensitive to transmission and reflection than single layer model. These provided a measurement method to reconstruct the biaxial anisotropic medium parameters.

Keywords

anisotropic media; electromagnetic wave propagation; electromagnetic wave reflection; electromagnetic wave transmission; measurement; biaxial anisotropic medium parameters; double-layers model; dual-layers measurement model; medium parameter reconstruction; reflection formula; single-layer model; transmission formula; Anisotropic magnetoresistance; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic reflection; Electromagnetic scattering; Laboratories; Magnetic fields; Radar measurements; Slabs; Tensile stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2004. ICMMT 4th International Conference on, Proceedings

Print_ISBN

0-7803-8401-6

Type

conf

DOI

10.1109/ICMMT.2004.1411629

Filename

1411629