CONCURRENT ERROR DETECTION IN LINEAR ANALOG AND SWITCHED-CAPACITOR STATE VARIABLE SYSTEMS USING CONT
Author :
Chatterjee, Abhijit
fYear :
1991
fDate :
26-30 Oct 1991
Firstpage :
582
Keywords :
Capacitors; Circuit testing; Control systems; Digital signal processing; Electrical fault detection; Error correction; Fault detection; Fault tolerance; Process control; Signal processing algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1991, Proceedings., International