DocumentCode
2873635
Title
Two-dimensional spectral shearing interferometry (2DSI) for ultrashort pulse characterization
Author
Birge, Jonathan R. ; Ell, Richard ; Kärtner, Franz X.
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Inst. of Technol., Cambridge, MA
fYear
2006
fDate
21-26 May 2006
Firstpage
1
Lastpage
2
Abstract
We present a new pulse characterization method based on two-dimensional spectral shearing interferometry with zero delay. It features simple calibration, greatly relaxed spectrometer resolution, and is well suited for few-cycle laser pulses.
Keywords
high-speed optical techniques; laser beams; laser variables measurement; light interferometry; optical correlation; pulse measurement; shearography; dispersive splitting; interferometric autocorrelation; laser pulses; two-dimensional spectral shearing interferometry; ultrashort pulse characterization; Calibration; Chirp; Delay; Frequency; Optical interferometry; Optical pulses; Phase measurement; Pulse measurements; Shearing; Spectroscopy; (120.5050) Phase measurement; (320.7100) Ultrafast measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location
Long Beach, CA
Print_ISBN
978-1-55752-813-1
Electronic_ISBN
978-1-55752-813-1
Type
conf
DOI
10.1109/CLEO.2006.4628389
Filename
4628389
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