Title :
Two-dimensional spectral shearing interferometry (2DSI) for ultrashort pulse characterization
Author :
Birge, Jonathan R. ; Ell, Richard ; Kärtner, Franz X.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Inst. of Technol., Cambridge, MA
Abstract :
We present a new pulse characterization method based on two-dimensional spectral shearing interferometry with zero delay. It features simple calibration, greatly relaxed spectrometer resolution, and is well suited for few-cycle laser pulses.
Keywords :
high-speed optical techniques; laser beams; laser variables measurement; light interferometry; optical correlation; pulse measurement; shearography; dispersive splitting; interferometric autocorrelation; laser pulses; two-dimensional spectral shearing interferometry; ultrashort pulse characterization; Calibration; Chirp; Delay; Frequency; Optical interferometry; Optical pulses; Phase measurement; Pulse measurements; Shearing; Spectroscopy; (120.5050) Phase measurement; (320.7100) Ultrafast measurement;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4628389
