• DocumentCode
    2873789
  • Title

    Test Vector Generation for Linear Analog Devices

  • Author

    Tsai, Sheng-Jen

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    592
  • Keywords
    Band pass filters; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic circuits; Logic devices; Logic testing; Quadratic programming; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519722
  • Filename
    519722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2873789