Title :
A self-testing PLA
Author :
Grassl, G. ; Pfleiderer
Author_Institution :
Siemens Research Laboratories, Munich, Germany
Abstract :
A technique affording recognition of all stuck-at faults and shorts within a PLA will be presented; each matrix transistor is addressed via shift registers. PLA specific problems of high fan-in are solved with an area overhead of less than 20%.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit technology; Logic testing; Programmable logic arrays; Registers; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1982.1156329
