DocumentCode :
2874014
Title :
Thermal Analysis of Advanced 3D Stacked Systems
Author :
Vaddina, Kameswar Rao ; Rahmani, Amir-Mohammad ; Latif, Khalid ; Liljeberg, Pasi ; Plosila, Juha
Author_Institution :
Turku Center for Comput. Sci. (TUCS), Turku, Finland
fYear :
2011
fDate :
4-6 July 2011
Firstpage :
371
Lastpage :
372
Abstract :
In this work, a 3D thermal model of a multicore system is developed to investigate the effects of hotspot, and placement of silicon die layers, on the thermal performance of a modern flip-chip package. In this regard, both the steady-state and transient heat transfer analysis has been performed on the 3D flip-chip package. Two different stacked die configurations were evaluated under different operating conditions. Through experimental simulations, we have found a configuration which has better thermal performance. The optimal placement solution is also provided based on the maximum temperature attained by the individual silicon dies. We have also provided the improvement that is required in the heat sink thermal resistance of a 3D system when compared to the single-die system.
Keywords :
flip-chip devices; heat transfer; integrated circuit packaging; thermal analysis; thermal management (packaging); transient analysis; 3D flip-chip package; 3D thermal model; advanced 3D stacked systems; flip-chip package; heat sink thermal resistance; multicore system; optimal placement solution; silicon die layers; single-die system; steady-state analysis; thermal analysis; transient heat transfer analysis; Heat sinks; Heat transfer; Silicon; Steady-state; Thermal resistance; Three dimensional displays; 3D stacked dies; thermal model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2011 IEEE Computer Society Annual Symposium on
Conference_Location :
Chennai
ISSN :
2159-3469
Print_ISBN :
978-1-4577-0803-9
Electronic_ISBN :
2159-3469
Type :
conf
DOI :
10.1109/ISVLSI.2011.36
Filename :
5992529
Link To Document :
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