Lateral field enhanced band-trap-band tunneling current in a 0.5 μm "off" state mosfet

Author

Wang, Tahui ; Huang, C. ; Chang, T.E. ; Chou, J.W. ; Chang, C.Y.

Author_Institution

National Chiao Tung University

fYear

1994

fDate

1994

Firstpage

43957

Lastpage

45052

Keywords

Charge carrier processes; Electron traps; Hot carriers; Interface states; Laboratories; Leakage current; MOSFET circuits; Stress; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International

Type

DOI

10.1109/EDMS.1994.771216

Filename

771216

Link To Document