DocumentCode :
2874078
Title :
Temperature dependence of porous silicon resistance
Author :
Yu, Insik ; Park, H-Kyoo ; Cho, Chan-Seob ; Shin, Jang-Kyoo ; Lee, Jung-Hee ; Lee, Jong-Hyun
Author_Institution :
Kyungpook National University
fYear :
1994
fDate :
1994
Firstpage :
46881
Lastpage :
11451
Keywords :
Electric resistance; Electrical resistance measurement; Flowcharts; Gold; Hafnium; Resistors; Silicon; Temperature dependence; Temperature measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
Type :
conf
DOI :
10.1109/EDMS.1994.771218
Filename :
771218
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2874078
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