Title :
An analytical model and experimental results of a highly integrateable magnetic field sensor
Author :
Lau, Jack ; Ko, Ping K. ; Chan, Philip C.H.
Author_Institution :
The Hong Kong University of Science & Technology
Keywords :
1f noise; Analytical models; CMOS technology; Geometry; Lifting equipment; MOSFETs; Magnetic field measurement; Magnetic fields; Magnetic sensors; Threshold voltage;
Conference_Titel :
Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International
DOI :
10.1109/EDMS.1994.771221
