Title :
A MIXED FUNCTIONAL/IDDQ TESTING METHODOLOGY FOR CMOS TRANSISTOR FAULTS
Author :
Vandris, E. ; Sobelman, G.
Keywords :
CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Switching circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519724
