DocumentCode
2874158
Title
A MIXED FUNCTIONAL/IDDQ TESTING METHODOLOGY FOR CMOS TRANSISTOR FAULTS
Author
Vandris, E. ; Sobelman, G.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
608
Keywords
CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519724
Filename
519724
Link To Document