DocumentCode
2874307
Title
High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms
Author
Chen, Chun-Hung ; Abraham, Jacob A.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
615
Keywords
CMOS integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Manufacturing; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519725
Filename
519725
Link To Document