Ionization of ar with circularly polarized 5.5-fs pulses for the determination of CEO phase

Author

Schlup, Philip ; Eckle, Petrissa R. ; Aghajani-Talesh, Anoush ; Biegert, Jens ; Smolarski, Mathias P. ; Staudte, Andrè ; Schöffler, Markus ; Jagutzki, Ottmar ; Dörner, Reinhard ; Keller, Ursula

Author_Institution

Dept. of Phys., ETH Zurich, Zurich

fYear

2006

fDate

21-26 May 2006

Firstpage

1

Lastpage

2

Abstract

The ionization rate of Ar with circularly polarized ultrashort laser pulses shows a spatial dependence attributable to the carrier-envelope phase of the pulse. A numerical simulation shows similar characteristics.

Keywords

argon; high-speed optical techniques; ionisation; light polarisation; numerical analysis; Ar; CEO phase; argon ionization rate; carrier-envelope phase; circular polarization; numerical simulation; spatial dependence; ultrashort laser pulses; Argon; Atom optics; Detectors; Gas lasers; Ionization; Laser theory; Optical polarization; Optical pulses; Phase detection; Physics; (020.1670) Atomic and molecular physics, Coherent optical effects; (260.5210) Physical optics, Photoionization; (320.7090) Ultrafast optics, Ultrafast lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on

Conference_Location

Long Beach, CA

Print_ISBN

978-1-55752-813-1

Electronic_ISBN

978-1-55752-813-1

Type

conf

DOI

10.1109/CLEO.2006.4628436

Filename

4628436