مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2874460

Title :

Fault Location with Current Monitoring

Author :

Aitken, Robert C.

fYear :

1991

fDate :

26-30 Oct 1991

Firstpage :

623

Keywords :

Circuit faults; Circuit testing; Fault diagnosis; Fault location; Hardware; Monitoring; Performance evaluation; Semiconductor device modeling; System testing; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1991, Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-8186-9156-5

Type :

conf

DOI :

10.1109/TEST.1991.519726

Filename :

519726

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2874460